Impact of Gate Leakage on the Performance of Analog Integrated Circuits - A Simulation Study.

Kamala Hariharan Shoba Krishnan V. P. Gopinath

Published in: ESA/VLSI (2004)

Keyphrases

simulation study
integrated circuit
monte carlo
electron beam
analog vlsi
metal oxide semiconductor
analog circuits
data sets
search algorithm
low cost
high impact
multiple input