Embedding Test Patterns in Accumulator-Generated Sequences in O(1) Time.
Nestor IoannidisIoannis VoyiatzisPublished in: Panhellenic Conference on Informatics (2009)
Keyphrases
- sequential patterns
- test sequences
- temporal patterns
- complex patterns
- hough transform
- automatically generated
- sequence patterns
- vector space
- hidden markov models
- test data
- pattern discovery
- binary strings
- statistically significant
- high dimensional
- data structure
- event sequences
- similarity measure
- feature extraction
- long sequences
- movement patterns
- website