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A systematic fitting procedure for accurate force field models to reproduce ab initio phonon spectra of nanostructures.

Christopher BarrettLin-Wang Wang
Published in: Comput. Phys. Commun. (2016)
Keyphrases
  • force field
  • probabilistic model
  • statistical models
  • parametric models
  • least squares
  • model selection
  • statistical model
  • multiscale
  • prior knowledge