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SSP: Eliminating Redundant Writes in Failure-Atomic NVRAMs via Shadow Sub-Paging.

Yuanjiang NiJishen ZhaoHeiner LitzDaniel BittmanEthan L. Miller
Published in: MICRO (2019)
Keyphrases
  • eliminating redundant
  • failure detection
  • light source
  • multiscale
  • root cause
  • data structure
  • failure rate
  • failure prediction
  • neural network
  • computer vision
  • multi dimensional
  • shadow detection