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Selecting test methodologies for PLAs and random logic modules in VLSI circuits - an expert systems approach.

Sudipta BhawmikV. K. NarangParimal Pal Chaudhuri
Published in: Integr. (1989)
Keyphrases
  • vlsi circuits
  • expert systems
  • artificial intelligence
  • logic programming
  • low power
  • fuzzy logic
  • test cases
  • multi valued
  • data mining
  • image sequences
  • knowledge representation
  • computational intelligence
  • modal logic