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Lateral profiling of HCI induced damage in ultra-scaled FinFET devices with Id-Vd characteristics.
Miaomiao Wang
Richard G. Southwick
Kangguo Cheng
James H. Stathis
Published in:
IRPS (2018)
Keyphrases
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human computer interaction
high speed
human computer interface
mobile devices
database
knowledge base
mobile phone
artificial intelligence
e learning
data structure
user interface
embedded systems
damage detection