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Prognosis of chip-loss failure in high-power IGBT module by self-testing.

Yeke LiuDawei XiangYifan Fu
Published in: IECON (2016)
Keyphrases
  • high power
  • high density
  • low power
  • low cost
  • high speed
  • power supply
  • host computer
  • fault diagnosis
  • breast cancer
  • data center
  • ofdm system