Challenges for non-volatile memory & logic manufacturing utilizing magnetic tunnel junction on 300 mm wafer.
Keizo KinoshitaPublished in: ACM Great Lakes Symposium on VLSI (2011)
Keyphrases
- random access memory
- semiconductor manufacturing
- main memory
- flash memory
- manufacturing process
- lessons learned
- read write
- solid state
- manufacturing systems
- wafer fabrication
- key issues
- classical logic
- design considerations
- random access
- quality control
- low voltage
- production planning
- file system
- logic programming
- data storage
- manufacturing processes
- high speed
- process planning
- integrated circuit
- multi valued
- database
- modal logic
- memory requirements
- data management
- data structure
- database systems
- neural network