A Bayesian Demonstration of Reliability for Encapsulated Implanted Electronics.
Callum LamontFederico MazzaNick DonaldsonPublished in: NER (2019)
Keyphrases
- reliability analysis
- electrical engineering
- bayesian estimation
- bayesian learning
- evolutionary algorithm
- data driven
- artificial intelligence
- software reliability
- highly reliable
- posterior distribution
- bayesian inference
- maximum likelihood
- computer vision
- prior knowledge
- multiscale
- posterior probability
- bayesian networks
- case study
- bayesian methods
- website
- decision making
- social networks
- search engine
- neural network
- electronic circuits
- bayesian decision