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Impact of Sidewall Etching on the Dynamic Performance of GaN-on-Si E-Mode Transistors.

Alaleh TajalliEleonora CanatoArianna NardoMatteo MeneghiniArno StockmanPeter MoensEnrico ZanoniGaudenzio Meneghesso
Published in: IRPS (2019)
Keyphrases
  • integrated circuit
  • data sets
  • impact analysis
  • database
  • neural network
  • power consumption
  • dynamically changing