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Design of Nonbinary Error Correction Codes With a Maximum Run-Length Constraint to Correct a Single Insertion or Deletion Error for DNA Storage.

Xiaozhou LuSunghwan Kim
Published in: IEEE Access (2021)
Keyphrases
  • error correction
  • error detection
  • run length
  • data hiding
  • error correcting
  • error control
  • magnetic tape
  • non binary
  • ldpc codes
  • watermarking scheme
  • reed solomon
  • image sequences
  • gray level
  • bit errors
  • block codes