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Design of Nonbinary Error Correction Codes With a Maximum Run-Length Constraint to Correct a Single Insertion or Deletion Error for DNA Storage.
Xiaozhou Lu
Sunghwan Kim
Published in:
IEEE Access (2021)
Keyphrases
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error correction
error detection
run length
data hiding
error correcting
error control
magnetic tape
non binary
ldpc codes
watermarking scheme
reed solomon
image sequences
gray level
bit errors
block codes