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Explicit layout pattern density controlling based on transistor-array-style.

Chao GengBo LiuShigetoshi Nakatake
Published in: MWSCAS (2017)
Keyphrases
  • pattern matching
  • high speed
  • multiscale
  • integrated circuit
  • pattern discovery
  • programmable logic
  • database
  • case study
  • bayesian networks
  • layout design
  • content addressable memory