Sram cell stability metric under transient voltage noise.
Elena I. VatajeluÁlvaro Gómez-PauMichel RenovellJoan FiguerasPublished in: Microelectron. J. (2014)
Keyphrases
- power consumption
- noisy data
- low voltage
- steady state
- noise level
- random noise
- high voltage
- power system
- missing data
- rand index
- noise model
- signal to noise ratio
- image noise
- low power
- distance measure
- operating conditions
- similarity measure
- stability analysis
- data acquisition
- computational intelligence
- sensor networks