Latent Feature Representation via Unsupervised Learning for Pattern Discovery in Massive Electron Microscopy Image Volumes.
Gary B. HuangHuei-Fang YangShin-ya TakemuraPatricia K. RivlinStephen M. PlazaPublished in: CoRR (2020)
Keyphrases
- pattern discovery
- feature representation
- electron microscopy
- image volumes
- data analysis
- x ray
- magnetic resonance
- surface fitting
- feature extraction
- pattern mining
- thin film
- association rule mining
- face recognition
- sequential patterns
- low dimensional
- data mining
- feature set
- sparse representation
- mr images
- multiscale
- medical images
- dimensionality reduction
- machine learning
- data sets
- image registration
- decision trees
- image processing