Micro-prober for wafer-level low-noise measurements in MOS devices.
Carmine CiofiFelice CrupiCalogero PaceGraziella ScandurraPublished in: IEEE Trans. Instrum. Meas. (2003)
Keyphrases
- measurement noise
- high noise
- low signal to noise ratio
- measurement errors
- missing data
- noise level
- levels of abstraction
- data sets
- random noise
- noise free
- massively parallel
- noise reduction
- signal to noise ratio
- mobile devices
- genetic algorithm
- embedded systems
- noise model
- noisy data
- measurement data
- embedded devices
- measurement error
- database
- noise sensitivity