A reliability analysis of Double-Ring topologies with Dual Attachment using p-cycles for optical metro networks.
Pedro M. Santiago del RíoJosé Alberto HernándezJavier AracilJorge E. López de VergaraJerzy DomzalRobert WójcikPiotr CholdaKrzysztof WajdaJuan P. Fernández PalaciosÓscar González de DiosRaúl DuquePublished in: Comput. Networks (2010)