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Application-Independent Testing of 3-D Field Programmable Gate Array Interconnect Faults.
Yen-Lin Peng
Ding-Ming Kwai
Yung-Fa Chou
Cheng-Wen Wu
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
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field programmable gate array
hardware implementation
high speed
fine grained
machine learning
pattern recognition
fault diagnosis
hardware architecture
hardware software co design
low cost
test cases
programmable logic
fpga technology