Statistical modeling of reliability in logic devices.
Jochen SchleiferThomas CoenenTobias G. NollPublished in: Microelectron. Reliab. (2011)
Keyphrases
- statistical modeling
- statistical models
- mobile devices
- predictive modeling
- classical logic
- logic programming
- modal logic
- reliability analysis
- nonparametric bayesian
- proof theory
- defeasible logic
- multi valued
- mobile applications
- logical framework
- set theory
- digital circuits
- predicate logic
- smart phones
- deontic logic
- user interface