Test and debug features of the RTO7 chip.

Kees van Kaam Bart Vermeulen Henk Jan Bergveld

Published in: ITC (2005)

Keyphrases

prior knowledge
real time
high speed
image features
low level
feature vectors
machine learning
neural network
low cost
keypoints
test data
computer vision
high level
feature extraction
search engine
classification accuracy
co occurrence
database
key features