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Simulation and measurement of supply and substrate noise in mixed-signal ICs.

Brian E. OwensSirisha AdluriPatrick BirrerRobert ShreeveSasi Kumar ArunachalamKartikeya MayaramTerri S. Fiez
Published in: IEEE J. Solid State Circuits (2005)
Keyphrases
  • mixed signal
  • vlsi circuits
  • measurement error
  • low power
  • multi channel
  • weak signal detection
  • missing data
  • low cost
  • parallel processing