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Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements.

Yanjun LiEnder YilmazPete SarsonSule Ozev
Published in: ACM Trans. Design Autom. Electr. Syst. (2019)
Keyphrases
  • higher order
  • analog circuits
  • neural network
  • natural images
  • fault diagnosis
  • pairwise
  • relevance feedback
  • high order
  • artificial intelligence
  • relational databases
  • image features
  • markov random field
  • radio frequency