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Error bounds for capacitance extraction via window techniques.

Michael W. BeattieLawrence T. Pileggi
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
  • error bounds
  • theoretical analysis
  • worst case
  • high speed
  • finite sample
  • information extraction
  • sliding window
  • window size
  • information retrieval
  • knowledge extraction
  • fixed size
  • neural network
  • case study
  • upper bound