Detectors++: The Robust Baseline for a Defect Detection System.

Fityanul Akhyar Chih-Yang Lin Gugan S. Kathiresan Bharath Surianarayanan Chao-Yung Hsu

Published in: ICCE-TW (2021)

Keyphrases

defect detection
neural network
databases
real time
data sets
textured surfaces
database
learning algorithm
image processing
bayesian networks
computationally efficient
partial occlusion
automated visual inspection