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Detectors++: The Robust Baseline for a Defect Detection System.
Fityanul Akhyar
Chih-Yang Lin
Gugan S. Kathiresan
Bharath Surianarayanan
Chao-Yung Hsu
Published in:
ICCE-TW (2021)
Keyphrases
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defect detection
neural network
databases
real time
data sets
textured surfaces
database
learning algorithm
image processing
bayesian networks
computationally efficient
partial occlusion
automated visual inspection