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Interconnect Electromigration Modeling and Analysis for Nanometer ICs: From Physics to Full-Chip.

Sheldon X.-D. TanZeyu SunSheriff Sadiqbatcha
Published in: IPSJ Trans. Syst. LSI Des. Methodol. (2020)
Keyphrases
  • model validation
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  • data structure
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  • wireless sensor networks