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A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module.
Pushparajah Rajaguru
Hua Lu
Chris Bailey
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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formal model
computational model
high level
theoretical framework
conceptual model
knowledge base
bayesian networks
objective function
digital libraries
hidden markov models
probability distribution
theoretical analysis
experimental data
power consumption
multi layer
upper layer