• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

The PIC-TDD Framework of Test Data Design for Pattern Recognition Systems.

Xiangdong WangYing YangHong LiuYueliang Qian
Published in: Int. J. Adv. Pervasive Ubiquitous Comput. (2014)
Keyphrases
  • test data
  • pattern recognition
  • test cases
  • neural network
  • training data
  • test set
  • data sets
  • machine learning
  • case study
  • databases
  • learning algorithm
  • image processing
  • decision trees
  • database systems