Generating Type-Related Instances and Metric Learning to Overcoming Language Priors in VQA.
Chongxiang SunYing YangZhengtao YuChenliang GuoJia ZhaoPublished in: BICS (2023)
Keyphrases
- metric learning
- distance metric
- semi supervised
- distance metric learning
- machine learning and pattern recognition
- semi supervised clustering
- image database
- multi task
- dimensionality reduction
- semi supervised learning
- learning tasks
- distance function
- unlabeled data
- pattern recognition
- mahalanobis metric
- data mining
- subject to linear constraints
- labeled data
- text mining
- pairwise
- feature space
- feature extraction
- image segmentation
- feature selection