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Adaptive Artificial Neural Network-Coupled LDPC ECC as Universal Solution for 3-D and 2-D, Charge-Trap and Floating-Gate NAND Flash Memories.

Toshiki NakamuraYoshiaki DeguchiKen Takeuchi
Published in: IEEE J. Solid State Circuits (2019)
Keyphrases
  • artificial neural networks
  • floating gate
  • error correction
  • neural network
  • high speed
  • back propagation
  • learning rules
  • low density parity check