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Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array for yield enhancement.
Jing Li
Charles Augustine
Sayeef S. Salahuddin
Kaushik Roy
Published in:
DAC (2008)
Keyphrases
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random access memory
design considerations
low voltage
embedded dram
database
multi dimensional
design process
main memory
digital camera
memory access