Group Testing With DNA Chips: Generating Designs and Decoding Experiments.

Alexander Schliep David C. Torney Sven Rahmann

Published in: CSB (2003)

Keyphrases

group testing
disjoint sets
generation process
dna sequences
integrated circuit
high speed
design space
dna computing
genetic algorithm
high density
automatically generating
dna sequencing
high end
low complexity
decoding process
high throughput
computer systems