A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing.
Takahiro J. YamaguchiMasayuki KawabataMani SomaMasahiro IshidaK. SawamiKoichiro UekusaPublished in: ITC (2008)
Keyphrases
- significant improvement
- preprocessing
- computational cost
- pairwise
- experimental evaluation
- high precision
- high accuracy
- classification method
- support vector machine svm
- clustering method
- synthetic data
- feature set
- synthetic and real images
- high order
- mathematical model
- segmentation method
- detection method
- image processing
- support vector machine
- cost function
- multiscale