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Design-for-testability for reversible logic circuits based on bit-swapping.

Joyati MondalDebesh Kumar DasBhargab B. Bhattacharya
Published in: IET Quantum Commun. (2024)
Keyphrases
  • logic circuits
  • low power
  • functional decomposition
  • case study
  • gate array
  • high speed
  • signal processing
  • design process
  • logic synthesis
  • computer vision
  • image segmentation
  • pattern recognition
  • low cost