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Au, Ag and Cu-silicon RCE photodetectors based on the internal photoemission effect at 1.55 micron.
Maurizio Casalino
Luigi Sirleto
Luigi Moretti
Francesco Giuseppe Della Corte
Ivo Rendina
Published in:
Nano-Net (2007)
Keyphrases
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electron microscopy
transmission electron microscopy
x ray
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similarity measure
negative impact