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BIST for Deep Submicron ASIC Memories with High Performance Application.

Theo J. PowellWu-Tung ChengJoseph RayhawkOmer SammanPaul PolickeSherry Lai
Published in: ITC (2003)
Keyphrases
  • application specific
  • integrated circuit
  • cost effective
  • data sets
  • neural network
  • information retrieval
  • e learning
  • deep learning