A Multiview Metric Learning Method for Few-Shot Fine-Grained Classification.
Zhuang MiaoXun ZhaoJiabao WangBo XuYang LiHang LiPublished in: IEEE Access (2022)
Keyphrases
- fine grained
- metric learning
- distance metric
- classification accuracy
- machine learning
- similarity measure
- pairwise
- pattern recognition
- model selection
- distance metric learning
- coarse grained
- learning tasks
- learning process
- feature space
- feature extraction
- prior knowledge
- support vector machine
- unsupervised learning
- feature vectors
- decision trees
- learning algorithm
- neural network