Parallel Identity Testing for Skew Circuits with Big Powers and Applications.
Daniel KönigMarkus LohreyPublished in: CoRR (2015)
Keyphrases
- parallel implementation
- parallel processing
- big data
- data skew
- high speed
- software testing
- database
- test cases
- distributed memory machines
- chip design
- electronic circuits
- identity management
- multi core processors
- circuit design
- distributed memory
- computer architecture
- test data
- object oriented
- social media
- data sets
- real time