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On-chip cache device scaling limits and effective fault repair techniques in future nanoscale technology.
David Roberts
Nam Sung Kim
Trevor N. Mudge
Published in:
Microprocess. Microsystems (2008)
Keyphrases
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long term
silicon on insulator
cost effective
data processing
case study
high speed
fault diagnosis
memory subsystem
neural network
low cost
computer systems
prefetching
fault detection