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A Novel Scheme for Tolerating Single Event/Multiple Bit Upsets (SEU/MBU) in Non-Volatile Memories.
Wei Wei
Kazuteru Namba
Yong-Bin Kim
Fabrizio Lombardi
Published in:
IEEE Trans. Computers (2016)
Keyphrases
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data sets
multiresolution
data management
main memory
classification scheme
management system
event detection
news articles
detection scheme
multiple targets
multiple independent
protection scheme