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Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies.

Donald A. GajewskiSatyaki GangulyScott T. SheppardSimon WoodJeff B. BarnerJim W. MilliganJohn Palmour
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • data mining
  • computer vision
  • learning systems
  • web intelligence
  • emerging technologies
  • information systems
  • learning environment
  • statistical analysis
  • reliability analysis