Low cost testing of multi-GBit device pins with ATE assisted loopback instrument.

William Fritzsche Asim E. Haque

Published in: ITC (2008)

Keyphrases

low cost
data acquisition
rfid tags
real time
expert systems
test cases
cost effective
digital camera
high density
database
decision trees
digital images
image processing
high speed
data sets
low power
hardware and software