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Hybrid BiST Solution for Analog to Digital Converters with Low-cost Automatic Test Equipment Compatibility.

Sachin Dileep DasnurkarJacob A. Abraham
Published in: ISCAS (2009)
Keyphrases
  • low cost
  • data driven
  • circuit design
  • digital media
  • search algorithm
  • semi automatic
  • fully automatic
  • real time
  • simulated annealing
  • data conversion