Derivation of the reliability metric for digital circuits.
Mohamed A. AbufalghaAlex BystrovPublished in: ETS (2017)
Keyphrases
- digital circuits
- data flow
- evolvable hardware
- model based diagnosis
- finite state machines
- metric space
- highly reliable
- distance function
- similarity metric
- cooperative
- distance metric
- metric learning
- functional decomposition
- decision diagrams
- circuit design
- evaluation metrics
- low cost
- database systems
- data integration
- distance measure
- evolutionary algorithm
- multi agent