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A fusion prognostics-based qualification test methodology for microelectronic products.
Michael G. Pecht
Tadahiro Shibutani
Myeongsu Kang
Melinda Hodkiewicz
Edward Cripps
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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information fusion
data fusion
statistical significance
database
databases
information retrieval
artificial intelligence
decision trees
multiresolution
test data
sensor fusion
product information
fusion process