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Diffraction by a Defect in an Open Waveguide: A Mathematical Analysis Based on a Modal Radiation Condition.
Anne-Sophie Bonnet-Ben Dhia
Ghania Dakhia
Christophe Hazard
Lahcène Chorfi
Published in:
SIAM J. Appl. Math. (2009)
Keyphrases
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mathematical analysis
x ray
waveguide
infrared
sufficient conditions
signal processing
medical imaging
modal logic
defect detection
neural network
image processing
electron microscopy