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Biased Voting for Improved Yield in Nanoscale Fabrics.

Md. Muwyid U. KhanPritish NarayananPriyamvada VijayakumarIsrael KorenC. Mani KrishnaCsaba Andras Moritz
Published in: DFT (2011)
Keyphrases
  • expert systems
  • improved algorithm
  • defect detection
  • data sets
  • social networks
  • database systems