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Biased Voting for Improved Yield in Nanoscale Fabrics.
Md. Muwyid U. Khan
Pritish Narayanan
Priyamvada Vijayakumar
Israel Koren
C. Mani Krishna
Csaba Andras Moritz
Published in:
DFT (2011)
Keyphrases
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expert systems
improved algorithm
defect detection
data sets
social networks
database systems