Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric.

Elena I. Vatajelu Álvaro Gómez-Pau Michel Renovell Joan Figueras

Published in: Asian Test Symposium (2011)

Keyphrases

decision trees
noise model
signal to noise ratio
noisy data
high speed
noise reduction
noise level
input data
missing data
data transmission
data sets
random noise
low cost
multiscale
metric space
gaussian noise
noise sensitivity