Detecting FET Stuck-Open Faults in CMOS Latches and Flip-Flops.

Madhukar K. Reddy Sudhakar M. Reddy

Published in: IEEE Des. Test (1986)

Keyphrases

flip flops
power dissipation
chip design
low power
power consumption
fault diagnosis
low cost
multiple input
fault detection
cmos technology
high speed
power supply
master slave
digital signal processing
analog vlsi
image processing
input output
fuzzy logic
image analysis