Login / Signup

Comparing two binary diagnostic tests in the presence of verification bias.

José Antonio Roldán NofuentesJuan de Dios Luna del Castillo
Published in: Comput. Stat. Data Anal. (2006)
Keyphrases
  • diagnostic tests
  • model checking
  • fault isolation
  • computer vision
  • face verification
  • formal verification
  • concurrent systems
  • real time
  • e learning
  • trade off
  • non binary
  • binary data
  • binary features