Positive and negative threshold voltage instabilities in GaN-based transistors.
Gaudenzio MeneghessoMatteo MeneghiniCarlo De SantiMaria RuzzarinEnrico ZanoniPublished in: Microelectron. Reliab. (2018)
Keyphrases
- positive and negative
- decision rules
- positive or negative
- power system
- field effect transistors
- power supply
- training instances
- transmission line
- integrated circuit
- positive examples
- high density
- pattern recognition
- electric field
- power consumption
- steady state
- semi supervised
- image retrieval
- low power
- structuring elements
- data distribution
- circuit design
- fuzzy logic
- positive data
- machine learning