Automatic generation of memory consistency tests for chip multiprocessing.
Eberle A. RamboOlav P. HenschelLuiz C. V. dos SantosPublished in: ICECS (2011)
Keyphrases
- high speed
- analog vlsi
- random access memory
- low cost
- memory subsystem
- automatically generate
- memory access
- memory usage
- consistency checking
- digital signal processors
- physical design
- limited memory
- computing power
- high density
- memory requirements
- random access
- vlsi implementation
- level parallelism
- statistical tests
- memory space
- data transfer
- memory management
- power dissipation
- programmable logic
- global constraints
- host computer
- real time